Sciweavers

257 search results - page 10 / 52
» Electronic circuit reliability modeling
Sort
View
ICES
2001
Springer
91views Hardware» more  ICES 2001»
14 years 2 months ago
Untidy Evolution: Evolving Messy Gates for Fault Tolerance
Abstract. The exploitation of the physical characteristics has already been demonstrated in the intrinsic evolution of electronic circuits. This paper is an initial attempt at crea...
Julian F. Miller, Morten Hartmann
CEC
2008
IEEE
14 years 4 months ago
Automatic model type selection with heterogeneous evolution: An application to RF circuit block modeling
— Many complex, real world phenomena are difficult to study directly using controlled experiments. Instead, the use of computer simulations has become commonplace as a cost effe...
Dirk Gorissen, Luciano De Tommasi, Jeroen Croon, T...
DATE
2010
IEEE
134views Hardware» more  DATE 2010»
14 years 2 months ago
Pseudo-CMOS: A novel design style for flexible electronics
Flexible electronics have attracted much attention since they enable promising applications such as lowcost RFID tags and e-paper. Thin-film transistors (TFTs) are considered as ...
Tsung-Ching Huang, Kenjiro Fukuda, Chun-Ming Lo, Y...
ICCAD
2008
IEEE
103views Hardware» more  ICCAD 2008»
14 years 6 months ago
Graphene nanoribbon FETs: technology exploration and CAD
Graphene nanoribbon FETs (GNRFETs) have emerged as a promising candidate for nanoelectronics applications. This paper summarizes (i) current understanding and prospects for GNRFET...
Kartik Mohanram, Jing Guo
IWSSD
2000
IEEE
14 years 2 months ago
Specification, Safety and Reliability Analysis Using Stochastic Petri Net Models
In this study we focus on the specification and assessment of Stochastic Petri net (SPN) models to evaluate the design of an embedded system for reliability and availability. The ...
Frederick T. Sheldon, Stefan Greiner, Matthias Ben...