257 search results - page 19 / 52 » Electronic circuit reliability modeling |
DSD
2007
IEEE
14 years 4 months ago
2007
IEEE
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
MJ
2007
13 years 9 months ago
2007
Recent algorithmic advances in Boolean satisfiability (SAT), along with highly efficient solver implementations, have enabled the successful deployment of SAT technology in a wi...
DSD
2008
IEEE
14 years 4 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...