257 search results - page 27 / 52 » Electronic circuit reliability modeling |
VLSID
2008
IEEE
14 years 10 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
ASYNC
2000
IEEE
14 years 2 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
ERCIMDL
2000
Springer
14 years 1 months ago
2000
Springer
This paper studies the archival problem: how a digital library can preserve electronic documents over long periods of time. We analyze how an archival repository can fail and we p...
DFT
2003
IEEE
14 years 3 months ago
2003
IEEE
In the last years, new requirements in terms of vehicle performance increased significantly the amount of on-board electronics, thus raising more concern about safety and fault to...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...