257 search results - page 29 / 52 » Electronic circuit reliability modeling |
SAFECOMP
2000
Springer
14 years 1 months ago
2000
Springer
Increasingly, the dependability of vehicle based programmable systems is becoming a key feature in ensuring the safety of those in and around the vehicle. The goal of those respons...
ASPDAC
2004
ACM
14 years 3 months ago
2004
ACM
— Reducing the ever-growing leakage power is critical to power efficient designs. Leakage reduction techniques such as power-gating using sleep transistor insertion introduces la...
ATS
2009
IEEE
13 years 7 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...