257 search results - page 3 / 52 » Electronic circuit reliability modeling |
ISQED
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
ISCAS
2002
IEEE
14 years 2 months ago
2002
IEEE
With single-electron tunneling (SET) technology it is possible to build electronic circuits with extreme low power properties. These SET circuits must therefore operate in the sin...
RTCSA
2005
IEEE
14 years 3 months ago
2005
IEEE
We propose a new architecture for a content protection system that conceals confidential data and algorithms in an FPGA as electrical circuits. This architecture is designed for a...
MVA
1994
13 years 11 months ago
1994
CT This paper presents a rapid detecting method to tell the external contours from internal ones, and adopt an aid measure of adding 'black points" . These two methods re...