257 search results - page 40 / 52 » Electronic circuit reliability modeling |
GLVLSI
2002
IEEE
14 years 2 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ECOOPW
2008
Springer
13 years 11 months ago
2008
Springer
EOOLT'2007 was the first edition of the ECOOP-EOOLT workshop. The workshop is intended to bring researchers associated with different equation-based object-oriented (EOO) mode...
VLSID
2006
IEEE
14 years 3 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
ISPD
2006
ACM
14 years 3 months ago
2006
ACM
The existing decoupling capacitance optimization approaches meet constraints on input impedance for package. In this paper, we show that using impedance as constraints leads to la...
DAC
2005
ACM
13 years 11 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...