257 search results - page 6 / 52 » Electronic circuit reliability modeling |
IH
1998
Springer
14 years 2 months ago
1998
Springer
Theoretical modeling of watermarks allow prediction of the detector reliability and facilitates the development of more reliable systems. In particular, mathematical evaluation is ...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
— Designers require variational information for robust designs. Characterization of such information can be costly for the novel nanoparticle interconnect process, which utilize ...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultralow-power designs may even permit embedded systems...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...