67 search results - page 10 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
CAINE
2003
13 years 9 months ago
2003
Most distributed real-time embedded systems are specified combining state diagram and data flow languages. This leads to several real-time codes which together do not necessaril...
ICASSP
2011
IEEE
12 years 11 months ago
2011
IEEE
—Detection of targets in complex environments is of importance in both radar and sonar applications. Recent work has shown that the use of Time Reversal (TR) techniques improves ...
IPSN
2007
Springer
14 years 1 months ago
2007
Springer
A Wireless Sensor Network (WSN) for Structural Health Monitoring (SHM) is designed, implemented, deployed and tested on the 4200ft long main span and the south tower of the Golden...
ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
DATE
2010
IEEE
14 years 18 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...