Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
Jason A. Blome, Shuguang Feng, Shantanu Gupta, Sco...
This paper describes a comprehensive prototype of large-scale fault adaptive embedded software developed for the proposed Fermilab BTeV high energy physics experiment. Lightweight...
Derek Messie, Mina Jung, Jae C. Oh, Shweta Shetty,...
To provide Quality of Service (QoS) guarantees in open and unpredictable environments, the utilization control problem is defined to keep the processor utilization at the schedula...
As Intrusion Detection Systems (IDS) utilize more complex syntax to efficiently describe complex attacks, their processing requirements increase rapidly. Hardware and, even more, ...
Ioannis Sourdis, Vassilis Dimopoulos, Dionisios N....
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...