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DATE
2008
IEEE
139views Hardware» more  DATE 2008»
14 years 1 months ago
Scan Chain Organization for Embedded Diagnosis
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
Melanie Elm, Hans-Joachim Wunderlich
DAC
1999
ACM
13 years 11 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
DCC
2001
IEEE
14 years 7 months ago
Group Testing for Wavelet Packet Image Compression
This paper introduces Group Testing for Wavelet Packets (GTWP), a novel embedded image compression algorithm based on wavelet packets and group testing. This algorithm extends the...
Edwin S. Hong, Richard E. Ladner, Eve A. Riskin
DATE
2002
IEEE
97views Hardware» more  DATE 2002»
14 years 9 days ago
Analog IP Testing: Diagnosis and Optimization
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...
Carlo Guardiani, Patrick McNamara, Lidia Daldoss, ...
SUTC
2008
IEEE
14 years 1 months ago
Service-Oriented Design Methodology for Wireless Sensor Networks: A View through Case Studies
— In this paper we discuss the design methodology based on the service-oriented architecture and agile development principles for wireless embedded and sensor networks (WSNs). Th...
Elena Meshkova, Janne Riihijärvi, Frank Oldew...