87 search results - page 8 / 18 » Embedded X86 testing methodology |
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Network applications are becoming increasingly popular in the embedded systems domain requiring high performance, which leads to high energy consumption. In networks is observed t...
HIS
2009
13 years 5 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...