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ICCD
2005
IEEE
221views Hardware» more  ICCD 2005»
16 years 3 days ago
Broadband Impedance Matching for Inductive Interconnect in VLSI Packages
Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
Brock J. LaMeres, Sunil P. Khatri
ICCAD
2006
IEEE
190views Hardware» more  ICCAD 2006»
16 years 2 days ago
Factor cuts
Enumeration of bounded size cuts is an important step in several logic synthesis algorithms such as technology mapping and re-writing. The standard algorithm does not scale beyond...
Satrajit Chatterjee, Alan Mishchenko, Robert K. Br...
SOSP
2003
ACM
16 years 2 days ago
Improving the reliability of commodity operating systems
Despite decades of research in extensible operating system technology, extensions such as device drivers remain a significant cause of system failures. In Windows XP, for example,...
Michael M. Swift, Brian N. Bershad, Henry M. Levy
ASPLOS
2010
ACM
15 years 10 months ago
Shoestring: probabilistic soft error reliability on the cheap
Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
CHI
2010
ACM
15 years 10 months ago
The design and evaluation of an end-user-deployable, whole house, contactless power consumption sensor
We present the design, development, and evaluation of an end-user installable, whole house power consumption sensing system capable of gathering accurate real-time power use that ...
Shwetak N. Patel, Sidhant Gupta, Matthew S. Reynol...