1943 search results - page 16 / 389 » End-to-End Integration Testing |
146
Voted
SEUS
2007
IEEE
15 years 10 months ago
2007
IEEE
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
150
click to vote
ICCD
2004
IEEE
16 years 17 days ago
2004
IEEE
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...
129
Voted
VLSID
2009
IEEE
16 years 4 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
124
Voted
ATS
1998
IEEE
15 years 8 months ago
1998
IEEE
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
171
Voted
ICDE
2005
IEEE
16 years 5 months ago
2005
IEEE
