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ICCAD
2001
IEEE
113views Hardware» more  ICCAD 2001»
16 years 19 days ago
The Design and Optimization of SOC Test Solutions
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...
Erik Larsson, Zebo Peng, Gunnar Carlsson
92
Voted
ASPDAC
2008
ACM
115views Hardware» more  ASPDAC 2008»
15 years 5 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...
128
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JAR
2006
99views more  JAR 2006»
15 years 3 months ago
An Integrated Approach to High Integrity Software Verification
Using automated reasoning techniques, we tackle the niche activity of proving that a program is free from run-time exceptions. Such a property is particularly valuable in high inte...
Andrew Ireland, Bill J. Ellis, Andrew Cook, Roderi...
ISSAC
1995
Springer
93views Mathematics» more  ISSAC 1995»
15 years 7 months ago
Finding Roots of Unity Among Quotients of the Roots of an Integral Polynomial
We present an efficient algorithm for testing whether a given integral polynomial has two distinct roots a, B such that fflp is a root of unity. The test is based on results obtai...
Kazuhiro Yokoyama, Ziming Li, István Nemes
ICML
2007
IEEE
16 years 4 months ago
Discriminative learning for differing training and test distributions
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
Michael Brückner, Steffen Bickel, Tobias Sche...