Mobile phones are becoming increasingly sophisticated with a rich set of on-board sensors and ubiquitous wireless connectivity. However, the ability to fully exploit the sensing c...
Component failure in large-scale IT installations is becoming an ever larger problem as the number of components in a single cluster approaches a million. In this paper, we presen...
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
Jason A. Blome, Shuguang Feng, Shantanu Gupta, Sco...
Software defects, commonly known as bugs, present a serious challenge for system reliability and dependability. Once a program failure is observed, the debugging activities to loc...
This paper presents a new approach to software reliability modeling by grouping data into clusters of homogeneous failure intensities. This series of data clusters associated with...