During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
We take a dual view of Markov processes ? advocated by Kozen ? as transformers of bounded measurable functions. We redevelop the theory of labelled Markov processes from this view ...
Philippe Chaput, Vincent Danos, Prakash Panangaden...
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
We study the problem of covering a set of points or polyhedra in 3 with two axis-aligned boxes in order to minimize a function of the measures of the two boxes, such as the sum or...
Esther M. Arkin, Gill Barequet, Joseph S. B. Mitch...
Symbolic image computation is the most fundamental computation in BDD-based sequential system optimization and formal verification. In this paper, we explore the use of over-appr...