710 search results - page 9 / 142 » Estimating design time for system circuits |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Three-dimensional integrated circuits (3DICs) have the potential to reduce interconnect lengths and improve digital system performance. However, heat removal is more difficult in ...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
: With technology scaling, elevated temperatures caused by increased power density create a critical bottleneck modulating the circuit operation. With the advent of FinFET technolo...
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
RTCSA
2005
IEEE
14 years 29 days ago
2005
IEEE
We propose a new architecture for a content protection system that conceals confidential data and algorithms in an FPGA as electrical circuits. This architecture is designed for a...