51 search results - page 9 / 11 » Estimating tranche spreads by loss process simulation |
DAC
1996
ACM
13 years 11 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
TVLSI
2010
13 years 1 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
ICIP
2002
IEEE
14 years 8 months ago
2002
IEEE
This paper presents a coordinated multiple-substream unequal error protection and error concealment algorithm for SPIHT-coded bitstreams transmitted over lossy channels. In the pr...
ECML
2006
Springer
13 years 10 months ago
2006
Springer
Abstract. Designs of micro electro-mechanical devices need to be robust against fluctuations in mass production. Computer experiments with tens of parameters are used to explore th...