72 search results - page 8 / 15 » Estimation and optimization of reliability of noisy digital ... |
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
CODES
2005
IEEE
14 years 1 months ago
2005
IEEE
Biochips based on digital microfluidics offer a powerful platform for massively parallel biochemical analysis such as clinical diagnosis and DNA sequencing. Current full-custom de...
ISPD
2003
ACM
14 years 27 days ago
2003
ACM
We propose a method to capture crosstalk-induced noisy waveform for crosstalk-aware static timing analysis. The effects of capacitive coupling noise on timing are conventionally m...
GLVLSI
1998
IEEE
13 years 12 months ago
1998
IEEE
Important layout properties of electronic designs include interconnection length values, clock speed, area requirements, and power dissipation. A reliable estimation of those prop...
ATS
2009
IEEE
13 years 5 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...