201 search results - page 11 / 41 » Evaluating Run-Time Techniques for Leakage Power Reduction |
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
Temperature is becoming a first rate design criterion in ASICs due to its negative impact on leakage power, reliability, performance, and packaging cost. Incorporating awareness o...
PATMOS
2007
Springer
14 years 1 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
VLSID
2006
IEEE
14 years 8 months ago
2006
IEEE
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
FPL
2008
Springer
13 years 9 months ago
2008
Springer
The power consumption of Dynamically Reconfigurable Processing Array (DRPA) is quantitatively analyzed by using a real chip layout and applications taking into account the reconfi...