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EMSOFT
2005
Springer
14 years 1 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
EMSOFT
2007
Springer
14 years 1 months ago
The revenge of the overlay: automatic compaction of OS kernel code via on-demand code loading
There is increasing interest in using general-purpose operating systems, such as Linux, on embedded platforms. It is especially important in embedded systems to use memory effici...
Haifeng He, Saumya K. Debray, Gregory R. Andrews
MICRO
2009
IEEE
148views Hardware» more  MICRO 2009»
14 years 2 months ago
Flip-N-Write: a simple deterministic technique to improve PRAM write performance, energy and endurance
The phase-change random access memory (PRAM) technology is fast maturing to production levels. Main advantages of PRAM are non-volatility, byte addressability, in-place programmab...
Sangyeun Cho, Hyunjin Lee
ICCAD
2009
IEEE
135views Hardware» more  ICCAD 2009»
13 years 5 months ago
Enhanced reliability-aware power management through shared recovery technique
While Dynamic Voltage Scaling (DVS) remains as a popular energy management technique for real-time embedded applications, recent research has identified significant and negative i...
Baoxian Zhao, Hakan Aydin, Dakai Zhu
HICSS
2008
IEEE
86views Biometrics» more  HICSS 2008»
14 years 2 months ago
Overcoming Impediments to Cell Phone Forensics
: Cell phones are an emerging but rapidly growing area of computer forensics. While cell phones are becoming more like desktop computers functionally, their organization and operat...
Wayne Jansen, Aurélien Delaitre, Ludovic Mo...