Many embedded systems contain resource constrained microcontrollers where applications, operating system components and device drivers reside within a single address space with no...
Ram Kumar, Akhilesh Singhania, Andrew Castner, Edd...
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
Multiprocessor systems present serious challenges in the design of real-time systems due to the wider variation of execution time of an instruction sequence compared to a uniproce...
DVFS remains an important energy management technique for embedded systems. However, its negative impact on transient fault rates has been recently shown. In this paper, we propos...
— In this paper, we examine the impact of application task mapping on the reliability of MPSoC in the presence of single-event upsets (SEUs). We propose a novel soft erroraware d...
Rishad A. Shafik, Bashir M. Al-Hashimi, Krishnendu...