68 search results - page 4 / 14 » Evaluation of voltage interpolation to address process varia... |
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...
VTS
2002
IEEE
14 years 11 days ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
MJ
2008
13 years 7 months ago
2008
Circuits optimized for minimum energy consumption operate typically in the subthreshold regime with ultra-low power-supply voltages. Speed of a subthreshold logic circuit is enhan...
TCAD
2008
13 years 7 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Deep-submicron designs have to take care of process variation effects as variations in critical process parameters result in large variations in access latencies of hardware compo...