469 search results - page 17 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
A new model for automatic generation of Evolutionary Algorithms (EAs) by evolutionary means is proposed in this paper. The model is based on a simple Genetic Algorithm (GA). Every...
DATE
2002
IEEE
14 years 19 days ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
GECCO
2009
Springer
14 years 9 days ago
2009
Springer
The generalized generation gap (G3) model of an evolutionary algorithm equipped with the parent centric crossover (PCX) is tested on the BBOB 2009 benchmark testbed. To improve it...