469 search results - page 18 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
KBSE
2002
IEEE
14 years 18 days ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...
DATE
2000
IEEE
14 years 3 days ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
ITC
1997
IEEE
13 years 12 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
ITC
2003
IEEE
14 years 29 days ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...