469 search results - page 36 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
GECCO
2009
Springer
14 years 3 months ago
2009
Springer
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
KBSE
1998
IEEE
14 years 1 months ago
1998
IEEE
We report on GADGET, a new software test generation system that uses combinatorial optimization to obtain condition/decision coverage of C/C++ programs. The GADGET system is fully...
RSP
1998
IEEE
14 years 1 months ago
1998
IEEE
STEP is an ISO standard (ISO-10303) for the computerinterpretable representation and exchange of product data. Parts of STEP standardize conceptual structures and usage ofinformat...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embe...
VLSID
2010
IEEE
13 years 6 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...