469 search results - page 3 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
ATS
2009
IEEE
14 years 9 hour ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
GECCO
2009
Springer
13 years 10 months ago
2009
Springer
Evolutionary functional testing is an approach to automatically generating test cases that violate a certain functional system requirement. This paper proposes an approach suitabl...
ETS
2006
IEEE
14 years 29 days ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
GECCO
2003
Springer
14 years 3 days ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...