469 search results - page 42 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
GLVLSI
2002
IEEE
14 years 1 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
TC
1998
13 years 8 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
GECCO
2005
Springer
14 years 2 months ago
2005
Springer
The size and complexity of systems based on multiple processing units demand techniques for the automatic diagnosis of their state. System-level diagnosis consists in determining ...