469 search results - page 6 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ITC
2000
IEEE
14 years 1 days ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract—This paper presents TestFul, an evolutionary testing approach for Java classes that works both at class and method level. TestFul exploits a multi-objective evolutionary...