- In this article, we explore the impact of strain on circuit performance when strained silicon (s-Si) devices are used for designing low-power high-speed circuits. Emphasis has be...
H. Ramakrishnan, K. Maharatna, S. Chattopadhyay, A...
— A closed-form model for simulation and analysis of voltage transients caused by single-event upsets (SEUs) in logic circuits is described. A linear RC model, derived using a SP...
In this paper, a new method for evolving simple electronic circuits is discussed, with the aim of improving the reliability and performance of basic circuit blocks. Next-generatio...
— Piecewise linear Lyapunov functions are used to design control gain matrices so that closed systems are robust stable and attractive regions are expanded as large as possible i...
— A cognitive system is presented, which is based on coupling a multi-objective evolutionary algorithm with a fuzzy information processing system. The aim of the system is to ide...