122 search results - page 10 / 25 » Evolvable Hardware for the Generation of Sequential Filter C... |
ICCAD
1995
IEEE
13 years 10 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
ASPDAC
2004
ACM
14 years 4 days ago
2004
ACM
— This paper focuses on checking safety properties for sequential circuits specified on the RTlevel. We study how different state encodings can be used to create a gate-level r...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...