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ASPDAC
2011
ACM
297views Hardware» more  ASPDAC 2011»
12 years 10 months ago
CELONCEL: Effective design technique for 3-D monolithic integration targeting high performance integrated circuits
3-D monolithic integration (3DMI), also termed as sequential integration, is a potential technology for future gigascale circuits. Since the device layers are processed in sequent...
Shashikanth Bobba, Ashutosh Chakraborty, Olivier T...
VTS
1999
IEEE
114views Hardware» more  VTS 1999»
13 years 11 months ago
Partial Scan Using Multi-Hop State Reachability Analysis
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
Sameer Sharma, Michael S. Hsiao
ICCAD
1998
IEEE
81views Hardware» more  ICCAD 1998»
13 years 11 months ago
A simultaneous routing tree construction and fanout optimization algorithm
- This paper presents an optimal algorithm for solving the problem of simultaneous fanout optimization and routing tree construction for an ordered set of critical sinks. The algor...
Amir H. Salek, Jinan Lou, Massoud Pedram
ICCS
2004
Springer
14 years 2 days ago
Intrinsic Evolution of Analog Circuits on a Programmable Analog Multiplexer Array
This work discusses an Evolvable Hardware (EHW) platform for the intrinsic evolution of analog electronic circuits. The EHW analog platform, named PAMA-NG (Programmable Analog Mult...
José Franco Machado do Amaral, Jorge Lu&iac...
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 3 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...