Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, ...
This work deals with the design of analog circuits for Artificial Neural Networks (ANNs) controllers using an Evolvable Hardware (EHW) platform. ANNs are massively parallel system...
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Mat...