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ITC
2000
IEEE
101views Hardware» more  ITC 2000»
14 years 2 days ago
Reducing test data volume using external/LBIST hybrid test patterns
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Debaleena Das, Nur A. Touba
MTV
2007
IEEE
118views Hardware» more  MTV 2007»
14 years 1 months ago
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
Wang-Dauh Tseng, Lung-Jen Lee
ICSE
1994
IEEE-ACM
13 years 11 months ago
TestTube: A System for Selective Regression Testing
This paper describes a system called TESTTUBE that combines static and dynamic analysis to perform selective retesting of software systems written in C. TESTTUBEfirst identifies w...
Yih-Farn Chen, David S. Rosenblum, Kiem-Phong Vo
SIGMOD
2008
ACM
93views Database» more  SIGMOD 2008»
14 years 7 months ago
The repeatability experiment of SIGMOD 2008
SIGMOD 2008 was the first database conference that offered to test submitters' programs against their data to verify the experiments published. This paper discusses the ratio...
Ioana Manolescu, Loredana Afanasiev, Andrei Arion,...
COMPSAC
2009
IEEE
13 years 5 months ago
Towards Call for Testing: An Application to User Acceptance Testing of Web Applications
1 The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in th...
Lian Yu, Wei Zhao, Xiaofeng Di, Changzhu Kong, Wen...