We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...
Lizheng Zhang, Weijen Chen, Yuhen Hu, John A. Gubn...
A high accuracy system for transistor-level static timing analysis is presented. Accurate static timing verification requires that individual gate and interconnect delays be accu...
Pawan Kulshreshtha, Robert Palermo, Mohammad Morta...
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
We present an efficient and accurate gate sizing tool that employs a novel piecewise convex delay model, handling both rise and fall delays, for static CMOS gates. The delay model...