87 search results - page 14 / 18 » Exploiting Instruction Redundancy for Transient Fault Tolera... |
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DSN
2002
IEEE
14 years 13 days ago
2002
IEEE
This paper presents an experimental evaluation of a brake-by-wire application that tolerates transient faults by temporal error masking. A specially designed real-time kernel that...
CDC
2009
IEEE
14 years 6 days ago
2009
IEEE
— The task in control allocation is to determine how to generate a specified generalized force from a redundant set of control effectors where the associated actuator control in...
ISCA
2005
IEEE
14 years 1 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...