87 search results - page 16 / 18 » Exploiting Instruction Redundancy for Transient Fault Tolera... |
HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
EMSOFT
2005
Springer
14 years 1 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
ISCA
1999
IEEE
13 years 11 months ago
1999
IEEE
Information integrity in cache memories is a fundamental requirement for dependable computing. Conventional architectures for enhancing cache reliability using check codes make it...
GLVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
IEEEPACT
2007
IEEE
14 years 1 months ago
2007
IEEE
Under current worst-case design practices, manufacturers specify conservative values for processor frequencies in order to guarantee correctness. To recover some of the lost perfo...