3909 search results - page 725 / 782 » Extreme Model Checking |
HPCA
2009
IEEE
14 years 10 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
KDD
2002
ACM
14 years 10 months ago
2002
ACM
The rapid growth of the world wide web had made the problem of topic speci c resource discovery an important one in recent years. In this problem, it is desired to nd web pages wh...
HPCA
2008
IEEE
14 years 10 months ago
2008
IEEE
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
RECOMB
2003
Springer
14 years 10 months ago
2003
Springer
Critical to the understanding of the genetic basis for complex diseases is the modeling of human variation. Most of this variation can be characterized by single nucleotide polymo...