604 search results - page 7 / 121 » Failure Mechanisms in MEMS |
WSC
2000
13 years 9 months ago
2000
This paper focuses on the production scheduling in MEMS (Micro-Electro Mechanical System) manufacturing. The whole MEMS production process can be organized into 3 sub-processes, i...
MR
2002
13 years 7 months ago
2002
This paper reviews the main failure mechanisms occurring in modern power modules paying special attention to insulated gate bipolar transistor devices for high-power applications....
ASPLOS
2011
ACM
12 years 11 months ago
2011
ACM
Main memory is responsible for a large and increasing fraction of the energy consumed by servers. Prior work has focused on exploiting DRAM low-power states to conserve energy. Ho...
AINA
2009
IEEE
14 years 1 months ago
2009
IEEE
—This paper proposes a novel recovery mechanism from large-scale network failures caused by earthquakes, terrorist attacks, large-scale power outages and software bugs. Our metho...
MR
2007
13 years 7 months ago
2007
A systematic methodology is developed in order to clarify the punch through Trench Insulated Gate Bipolar Transistor (T-IGBT) failure mechanisms which can occur under extreme oper...