The increasing size of integrated systems combined with deep submicron physical modeling details creates an explosion in RLC interconnect modeling complexity of unmanageable propo...
Michael W. Beattie, Satrajit Gupta, Lawrence T. Pi...
State-of-the-art technologies in very large scale integration (VLSI) allow for the realization of gates with varying energy consumptions and hence delays (i.e., processing speeds) ...
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
This paper presents a new method to extract functionally equivalent structures from logic netlists. It uses a fast functional regularity extraction algorithm based on structural e...