32 search results - page 5 / 7 » Fast Sequential Circuit Test Generation Using High-Level and... |
DAC
1990
ACM
13 years 11 months ago
1990
ACM
Symbolic simulation involves evaluating circuit behavior using special symbolic values to encode a range of circuit operating conditions. In one simulation run, a symbolic simulat...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
IFIP
2001
Springer
14 years 6 days ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...