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DAC
2000
ACM
14 years 8 months ago
Fast methods for extraction and sparsification of substrate coupling
The sudden increase in systems-on-a-chip designs has renewed interest in techniques for analyzing and eliminating substrate coupling problems. Previous work on the substrate coupl...
Joe Kanapka, Joel R. Phillips, Jacob White
ICCAD
2001
IEEE
124views Hardware» more  ICCAD 2001»
14 years 3 months ago
Highly Accurate Fast Methods for Extraction and Sparsification of Substrate Coupling Based on Low-Rank Approximation
More aggressive design practices have created renewed interest in techniques for analyzing substrate coupling problems. Most previous work has focused primarily on faster techniqu...
Joe Kanapka, Jacob White
ASPDAC
2007
ACM
94views Hardware» more  ASPDAC 2007»
13 years 11 months ago
A New Boundary Element Method for Multiple-Frequency Parameter Extraction of Lossy Substrates
-1 The couplings via realistic lossy substrates can be modeled as frequency-dependent coupling parameters. The fast extraction at multiple frequencies can be accomplished in two se...
Xiren Wang, Wenjian Yu, Zeyi Wang
DAC
1999
ACM
14 years 8 months ago
A Multiscale Method for Fast Capacitance Extraction
The many levels of metal used in aggressive deep submicron process technologies has made fast and accurate capacitance extraction of complicated 3-D geometries of conductors essen...
Johannes Tausch, Jacob K. White
ASPDAC
2005
ACM
107views Hardware» more  ASPDAC 2005»
13 years 9 months ago
Substrate resistance extraction with direct boundary element method
- It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents the direct boundary element method (BEM) for substrate resistance calc...
Xiren Wang, Wenjian Yu, Zeyi Wang