730 search results - page 44 / 146 » Faster dimension reduction |
KBSE
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents a tool that (i) constructs tree-based models of a program’s behavior during testing and (ii) employs these trees while reordering and reducing a test suite. ...
MTV
2007
IEEE
14 years 3 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
SODA
2003
ACM
13 years 10 months ago
2003
ACM
We prove the existence of small core-sets for solving approximate k-center clustering and related problems. The size of these core-sets is considerably smaller than the previously...
ISVLSI
2008
IEEE
14 years 3 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
ICAS
2005
IEEE
14 years 2 months ago
2005
IEEE
— The purpose of this study is to maintain efficient backup routes for restoring overlay trees. In most conventional methods, after a node leaves the trees, its children start se...