414 search results - page 4 / 83 » Fault Detection Effectiveness of Spathic Test Data |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
VTS
2003
IEEE
14 years 25 days ago
2003
IEEE
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establi...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
SAC
2011
ACM
12 years 10 months ago
2011
ACM
Regression testing is often performed with a time budget and it does not allow executing all test cases. Test case prioritization techniques re-order test cases to increase the ra...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...