As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...