21 search results - page 4 / 5 » Fault Diagnosis in Scan-Based BIST |
TCAD
2002
13 years 8 months ago
2002
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
IOLTS
2002
IEEE
14 years 1 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
CSREAESA
2008
13 years 10 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...