16 search results - page 3 / 4 » Fault Pattern Oriented Defect Diagnosis for Memories |
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
DATE
2002
IEEE
14 years 9 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
RTCSA
2008
IEEE
14 years 1 months ago
2008
IEEE
In an attempt to substitute NOR flash with NAND flash and provide more memory to applications, embedded systems have to use demand paging. However, demand paging drastically degra...
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ISCA
2009
IEEE
14 years 2 months ago
2009
IEEE
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...