— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
Jaroslav Borecky, Martin Kohlik, Hana Kubatova, Pa...
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate containing the fault takes on opposite values during the application...
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-...