Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
Uranmandakh Amgalan, Christian Hachmann, Sybille H...
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This...
Qiang Guo, Robert M. Hierons, Mark Harman, Karnig ...
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect p...