The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...