Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Bla...
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram